Photoreflectance measurement in Si3N4/Al0.21Ga0.79As/GaAs heterostructure /
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| Altri autori: | Bae, In-Ho., Choi, Sang-Su., Kim, Ki-Hong., Park, Hun-Bo., Yu, Jae-In. |
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| Natura: | Articolo |
| Lingua: | English |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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