Photoreflectance measurement in Si3N4/Al0.21Ga0.79As/GaAs heterostructure /

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Bibliographic Details
Other Authors: Bae, In-Ho., Choi, Sang-Su., Kim, Ki-Hong., Park, Hun-Bo., Yu, Jae-In.
Format: Article
Language:English
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Institutions: Thư viện Trường Đại học Đà Lạt