Raman microspectroscopy : A comparison of point, line, wide-field imaging methodologies /

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Raman microspectroscopy : A comparison of point, line, wide-field imaging methodologies /

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Bibliografske podrobnosti
Drugi avtorji:	Huffman, Scott W., Levin, Ira W., Schaeberle, Michael D., Schlucker, Sebastian.
Format:	Bài viết
Jezik:	English
Teme:	Image quality Imaging Raman spectrometry Spatial resolution Tunable filter
Oznake:	Označite Brez oznak, prvi označite!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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