Raman microspectroscopy : A comparison of point, line, wide-field imaging methodologies /
Spremljeno u:
| Daljnji autori: | Huffman, Scott W., Levin, Ira W., Schaeberle, Michael D., Schlucker, Sebastian. |
|---|---|
| Format: | Članak |
| Jezik: | English |
| Teme: | |
| Oznake: |
Dodaj oznaku
Bez oznaka, Budi prvi tko označuje ovaj zapis!
|
| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
|---|
Similar Items
- Identification of pigments in paint cross sections by reflection visible light imaging microspectroscopy /
- Bayesian methods for image super-resolution /
- Comparison of surface-enhanced resonance raman scattering from unaggregated and aggregated nanoparticles /
-
Design of mean filter using field programmable gate arrays for digital images
od: Duong, Huu Ai, i dr.
Izdano: (2024) -
Restoration of Bayer-sampled image sequences /
od: Gevrekci, Murat.