Raman microspectroscopy : A comparison of point, line, wide-field imaging methodologies /

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Raman microspectroscopy : A comparison of point, line, wide-field imaging methodologies /

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Altres autors:	Huffman, Scott W., Levin, Ira W., Schaeberle, Michael D., Schlucker, Sebastian.
Format:	Article
Idioma:	English
Matèries:	Image quality Imaging Raman spectrometry Spatial resolution Tunable filter
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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