Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Podrobná bibliografie
Hlavní autor:	May, Collin J.
Další autoři:	Canavan, Heather E., Castner, David G.
Médium:	Článek
Jazyk:	English
Témata:	Chemical sensors DNA Mass spectrometry Nucleoside Photoelectron spectrometry Principal component analysis X ray spectrometry
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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