Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

Đã lưu trong:

Chi tiết về thư mục
Tác giả chính:	May, Collin J.
Tác giả khác:	Canavan, Heather E., Castner, David G.
Định dạng:	Bài viết
Ngôn ngữ:	English
Những chủ đề:	Chemical sensors DNA Mass spectrometry Nucleoside Photoelectron spectrometry Principal component analysis X ray spectrometry
Các nhãn:	Thêm thẻ Không có thẻ, Là người đầu tiên thẻ bản ghi này!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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