Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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书目详细资料
主要作者:	May, Collin J.
其他作者:	Canavan, Heather E., Castner, David G.
格式:	Bài viết
语言:	English
主题:	Chemical sensors DNA Mass spectrometry Nucleoside Photoelectron spectrometry Principal component analysis X ray spectrometry
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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