Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Bibliografiske detaljer
Hovedforfatter:	May, Collin J.
Andre forfattere:	Canavan, Heather E., Castner, David G.
Format:	Bài viết
Sprog:	English
Fag:	Chemical sensors DNA Mass spectrometry Nucleoside Photoelectron spectrometry Principal component analysis X ray spectrometry
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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