Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

क्यूआर कोड

Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

में बचाया:

ग्रंथसूची विवरण
मुख्य लेखक:	May, Collin J.
अन्य लेखक:	Canavan, Heather E., Castner, David G.
स्वरूप:	लेख
भाषा:	English
विषय:	Chemical sensors DNA Mass spectrometry Nucleoside Photoelectron spectrometry Principal component analysis X ray spectrometry
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