Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Bibliografski detalji
Glavni autor:	May, Collin J.
Daljnji autori:	Canavan, Heather E., Castner, David G.
Format:	Članak
Jezik:	English
Teme:	Chemical sensors DNA Mass spectrometry Nucleoside Photoelectron spectrometry Principal component analysis X ray spectrometry
Oznake:	Dodaj oznaku Bez oznaka, Budi prvi tko označuje ovaj zapis!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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