Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Bibliographic Details
Main Author:	May, Collin J.
Other Authors:	Canavan, Heather E., Castner, David G.
Format:	Article
Language:	English
Subjects:	Chemical sensors DNA Mass spectrometry Nucleoside Photoelectron spectrometry Principal component analysis X ray spectrometry
Tags:	Add Tag No Tags, Be the first to tag this record!

Institutions:	Thư viện Trường Đại học Đà Lạt

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