Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

কিউআর কোড

Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

সংরক্ষণ করুন:

গ্রন্থ-পঞ্জীর বিবরন
প্রধান লেখক:	May, Collin J.
অন্যান্য লেখক:	Canavan, Heather E., Castner, David G.
বিন্যাস:	প্রবন্ধ
ভাষা:	English
বিষয়গুলি:	Chemical sensors DNA Mass spectrometry Nucleoside Photoelectron spectrometry Principal component analysis X ray spectrometry
ট্যাগগুলো:	ট্যাগ যুক্ত করুন কোনো ট্যাগ নেই, প্রথমজন হিসাবে ট্যাগ করুন!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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