Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Detaylı Bibliyografya
Yazar:	May, Collin J.
Diğer Yazarlar:	Canavan, Heather E., Castner, David G.
Materyal Türü:	Makale
Dil:	English
Konular:	Chemical sensors DNA Mass spectrometry Nucleoside Photoelectron spectrometry Principal component analysis X ray spectrometry
Etiketler:	Etiketle Etiket eklenmemiş, İlk siz ekleyin!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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