Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

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Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	May, Collin J.
مؤلفون آخرون:	Canavan, Heather E., Castner, David G.
التنسيق:	مقال
اللغة:	English
الموضوعات:	Chemical sensors DNA Mass spectrometry Nucleoside Photoelectron spectrometry Principal component analysis X ray spectrometry
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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