Short-channel effect and device design of extremely scaled tunnel field-effect transistors

For serving as ideal switching devices in future energy-efficient applications, scaling down the channel lengths of Tunnel-Field Effect Transistors (TFETs) is essential to follow the pace of Si-based CMOS technologies. This work elucidates the short-channel mechanisms and the role of the drain in ex...

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主要な著者: Nguyễn, Đăng Chiến, Chun-Hsing Shih
フォーマット: Journal article
言語:English
出版事項: 2023
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オンライン・アクセス:https://scholar.dlu.edu.vn/handle/123456789/2082
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