Semiconductor-thickness-dependent design of hetero-gate dielectric in double-gate TFETs

This study examined the dependence of the role and design of hetero-gate dielectric (HGD) on semiconductor film thickness in double-gate tunnel field-effect transistors (TFETs). The optimal position of the source-side dielectric heterojunction is nearly independent of the film thickness and aligned...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Prif Awduron: Nguyễn, Đăng Chiến, Nguyen Van Hao, Lê, Văn Tùng, Chun-Hsing Shih
Fformat: Conference paper
Iaith:English
Cyhoeddwyd: IEEE Publishing 2024
Pynciau:
Mynediad Ar-lein:https://scholar.dlu.edu.vn/handle/123456789/3288
Tagiau: Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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