Fringing field and short channel effects in thin-body SOI MOSFETs with shallow source/drain

This work explores numerically the short-channel effects in thin-body SOI MOSFETs with shallow source/drain architecture, where the junction depths are less than the associated silicon body thicknesses. Unique fringing field and short-channel behavior are observed in the unconventional SOI devices....

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Những tác giả chính: Jui-Kai Hsia, Chun-Hsing Shih, Ting-Shiuan Kang, Nguyễn, Đăng Chiến, Nguyen Van Kien
Định dạng: Conference paper
Ngôn ngữ:English
Được phát hành: IEEE Publishing 2024
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Truy cập trực tuyến:https://scholar.dlu.edu.vn/handle/123456789/3307
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spelling oai:scholar.dlu.edu.vn:123456789-33072024-03-02T10:05:24Z Fringing field and short channel effects in thin-body SOI MOSFETs with shallow source/drain Jui-Kai Hsia Chun-Hsing Shih Ting-Shiuan Kang Nguyễn, Đăng Chiến Nguyen Van Kien SOl MOSFETs Short-channel effect Silicon -on-insulator Shallow source/drain Fringing field This work explores numerically the short-channel effects in thin-body SOI MOSFETs with shallow source/drain architecture, where the junction depths are less than the associated silicon body thicknesses. Unique fringing field and short-channel behavior are observed in the unconventional SOI devices. Numerical results of the short-channel effects are compared with those in the conventional SOI MOSFETs. For given silicon body thicknesses, the shallow junction SOI devices exhibit the superior short-channel immunity over the conventional counterparts. 129-132 2024-03-02T10:05:16Z 2024-03-02T10:05:16Z 2013 Conference paper Bài báo đăng trên KYHT quốc tế (có ISBN) 978-1-4673-4800-3 https://scholar.dlu.edu.vn/handle/123456789/3307 10.1109/ULIS.2013.6523530 en International Conference on Ultimate Integration on Silicon (ULIS) [1] Y. Taur and T. Ning, Fundamental of Modern VLSI Devices. 2nd. New York: Cambridge Univ. Press, 2009. [2] 1. P. Colinge, "Subthreshold slope of thin-film SOl MOSFETs," IEEE Electron Device Lett., vol. EDL-7, no. 4, pp. 244--246, Apr. 1986. [3] B. Agrawal, V. K. De, 1. M. Pimbley, and 1. D. Meindl, "Short Channel Models and Scaling Limits of SO l and Bulk MOSFET's," IEEE Journal of Solid-State Circuits, vol. 29, no. 2, pp. 122-125, Feb. 1994. [4] V. Trivedi and J. Fossum, "Scaling fully depleted SOl CMOS," IEEE Trans. Electron Devices, vol. 50, no. 10, pp. 2095-2103, Oct. 2003. [5] Wei-Yuan Lu and Yuan Taur, "On the Scaling Limit of Ultrathin SOl MOSFETs," IEEE Trans. Electron Devices, vol. 53, no. 5, pp. 1137-1141, May 2006. [6] S. Burignat, M.K.M. Arshad, .I.-P. Raskin,Y. Kilchytska, D. Flandre, O. Faynot, P. Scheiblin, F. Andrieu, "Drain/Substrate coupling impact on DIBL of Ultra Thin Body and BOX SOl MOSFETswith undoped channel," in the European Solid-State Device Research Conference (ESSDERC), 2009, pp. 141-144. [7] Shunpei Abe, Yoshiyasu Miyazawa, Yoshikata Nakajima, Tatsuro Hanajiri, TofU Toyabe, and Takuo Sugano, "Suppression of DIBL in deca-nano SOl MOSFETs by controlling permittivity and thickness of BOX layers," in lOth International Conference on Ultimate Integration of Silicon, 2009. pp. 329-332. [8] C. Sampedro, F. Gamiz, L. Donetti, and A. Godoy, "Reaching sub-32 nm nodes: ET-FDSOI and BOX optimization," Solid-State Electron., vol. 70, pp. 101-105, Apr. 2012. [9] Synopsys MEDICI User's Manual, Synopsys Inc., Mountain View, CA, 2010. IEEE Publishing USA
institution Thư viện Trường Đại học Đà Lạt
collection Thư viện số
language English
topic SOl MOSFETs
Short-channel effect
Silicon -on-insulator
Shallow source/drain
Fringing field
spellingShingle SOl MOSFETs
Short-channel effect
Silicon -on-insulator
Shallow source/drain
Fringing field
Jui-Kai Hsia
Chun-Hsing Shih
Ting-Shiuan Kang
Nguyễn, Đăng Chiến
Nguyen Van Kien
Fringing field and short channel effects in thin-body SOI MOSFETs with shallow source/drain
description This work explores numerically the short-channel effects in thin-body SOI MOSFETs with shallow source/drain architecture, where the junction depths are less than the associated silicon body thicknesses. Unique fringing field and short-channel behavior are observed in the unconventional SOI devices. Numerical results of the short-channel effects are compared with those in the conventional SOI MOSFETs. For given silicon body thicknesses, the shallow junction SOI devices exhibit the superior short-channel immunity over the conventional counterparts.
format Conference paper
author Jui-Kai Hsia
Chun-Hsing Shih
Ting-Shiuan Kang
Nguyễn, Đăng Chiến
Nguyen Van Kien
author_facet Jui-Kai Hsia
Chun-Hsing Shih
Ting-Shiuan Kang
Nguyễn, Đăng Chiến
Nguyen Van Kien
author_sort Jui-Kai Hsia
title Fringing field and short channel effects in thin-body SOI MOSFETs with shallow source/drain
title_short Fringing field and short channel effects in thin-body SOI MOSFETs with shallow source/drain
title_full Fringing field and short channel effects in thin-body SOI MOSFETs with shallow source/drain
title_fullStr Fringing field and short channel effects in thin-body SOI MOSFETs with shallow source/drain
title_full_unstemmed Fringing field and short channel effects in thin-body SOI MOSFETs with shallow source/drain
title_sort fringing field and short channel effects in thin-body soi mosfets with shallow source/drain
publisher IEEE Publishing
publishDate 2024
url https://scholar.dlu.edu.vn/handle/123456789/3307
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