Quantum Confinement Effect in Strained-Si¬1-xGex Double-Gate Tunnel Field-Effect Transistors

The energy bandgap is a key factor to determine the tunneling current in tunnel field-effect transistors (TFETs). This paper numerically investigates the effect of quantum confinement in the double-gate TFETs by evaluating the effective energy-band bandgap of the ultra-thin strained-Si1-xGex body....

Celý popis

Uloženo v:
Podrobná bibliografie
Hlavní autoři: Nguyễn, Đăng Chiến, Chun-Hsing Shih, Luu The Vinh, Nguyen Van Kien
Médium: Conference paper
Jazyk:English
Vydáno: IEEE Publishing 2024
On-line přístup:https://scholar.dlu.edu.vn/handle/123456789/3308
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!
Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt