Quantum Confinement Effect in Strained-Si¬1-xGex Double-Gate Tunnel Field-Effect Transistors

The energy bandgap is a key factor to determine the tunneling current in tunnel field-effect transistors (TFETs). This paper numerically investigates the effect of quantum confinement in the double-gate TFETs by evaluating the effective energy-band bandgap of the ultra-thin strained-Si1-xGex body....

全面介紹

Đã lưu trong:
書目詳細資料
Những tác giả chính: Nguyễn, Đăng Chiến, Chun-Hsing Shih, Luu The Vinh, Nguyen Van Kien
格式: Conference paper
語言:English
出版: IEEE Publishing 2024
在線閱讀:https://scholar.dlu.edu.vn/handle/123456789/3308
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!
Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt