Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon /

Ítems similars

• Amorphous silicon and related materials
  per: Fritzsche, Hellmut
  Publicat: (1989)
• Amorphization of silicon by 250 keV electron irradiation and hydrogen annealing /
  per: Jo, Jung-Yol.
• Multimode detection of hydrogen gas using palladium-covered silicon micro-channels /
• On the effect of the amorphous silicon microstructure on the grain size of solid phase crystallized polycrystalline silicon /
• Hydrogen ion diffusion coefficient of a hydrogenated amorphous silicon thin film /
  per: Yu, George C.