Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon /

Liknande verk

• Amorphous silicon and related materials
  av: Fritzsche, Hellmut
  Publicerad: (1989)
• Amorphization of silicon by 250 keV electron irradiation and hydrogen annealing /
  av: Jo, Jung-Yol.
• Multimode detection of hydrogen gas using palladium-covered silicon micro-channels /
• On the effect of the amorphous silicon microstructure on the grain size of solid phase crystallized polycrystalline silicon /
• Hydrogen ion diffusion coefficient of a hydrogenated amorphous silicon thin film /
  av: Yu, George C.