Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon /

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Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon /

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Dades bibliogràfiques
Altres autors:	Chu, Byung-Yoon., Han, Byoung-Sung., Ko, Seok-Cheol., Yang, Sung-Chae.
Format:	Article
Idioma:	English
Matèries:	Hydrogenated amorphous silicon Paschen's law Spectroscopy
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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