Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon /

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Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon /

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Библиографические подробности
Другие авторы:	Chu, Byung-Yoon., Han, Byoung-Sung., Ko, Seok-Cheol., Yang, Sung-Chae.
Формат:	Статья
Язык:	English
Предметы:	Hydrogenated amorphous silicon Paschen's law Spectroscopy
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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