Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon /

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Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon /

Wedi'i Gadw mewn:

Manylion Llyfryddiaeth
Awduron Eraill:	Chu, Byung-Yoon., Han, Byoung-Sung., Ko, Seok-Cheol., Yang, Sung-Chae.
Fformat:	Erthygl
Iaith:	English
Pynciau:	Hydrogenated amorphous silicon Paschen's law Spectroscopy
Tagiau:	Ychwanegu Tag Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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