Development of parametric material, energy, emission inventories for wafer fabrication in the semiconductor industry /
Na minha lista:
| Outros Autores: | Allen, David T., Dyer, David E., Kenig, George A., Laurent, Jean-Philippe., Murphy, Cynthia F. |
|---|---|
| Formato: | Atigo |
| Idioma: | English |
| Assuntos: | |
| Tags: |
Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!
|
| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
|---|
Registros relacionados
-
Compilation and application of Japanese inventories for energy consumption and air pollutant emissions using input-output tables /
por: Nansai, Keisuke. -
Global gridded emission inventories of beta-hexachlorocyclohexane /
por: Li, Yi-Fan. -
Energy-related emissions from telework /
por: Kitou, Erasmia. -
Quantification of variability and uncertainty for air toxic emission inventories with censored emission factor data /
por: Frey, H. Christopher. -
Beyond the environmental Kuznets curve : A comparative study of SO2 and CO2 emissions between Japan and China /
por: Yaguchi, Yue.