Development of parametric material, energy, emission inventories for wafer fabrication in the semiconductor industry /
Wedi'i Gadw mewn:
| Awduron Eraill: | Allen, David T., Dyer, David E., Kenig, George A., Laurent, Jean-Philippe., Murphy, Cynthia F. |
|---|---|
| Fformat: | Erthygl |
| Iaith: | English |
| Pynciau: | |
| Tagiau: |
Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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Eitemau Tebyg
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Compilation and application of Japanese inventories for energy consumption and air pollutant emissions using input-output tables /
gan: Nansai, Keisuke. -
Global gridded emission inventories of beta-hexachlorocyclohexane /
gan: Li, Yi-Fan. -
Energy-related emissions from telework /
gan: Kitou, Erasmia. -
Quantification of variability and uncertainty for air toxic emission inventories with censored emission factor data /
gan: Frey, H. Christopher. -
Beyond the environmental Kuznets curve : A comparative study of SO2 and CO2 emissions between Japan and China /
gan: Yaguchi, Yue.