Size-dependent resistivity in nanoscale interconnects /

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Size-dependent resistivity in nanoscale interconnects /

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Dettagli Bibliografici
Autore principale:	Josell, Daniel.
Altri autori:	Brongersma, Sywert H., Tokei, Zsolt.
Natura:	Articolo
Lingua:	English
Soggetti:	Conductivity Copper Electrical resistivity Interconnects Nanowires Size effects
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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