Size-dependent resistivity in nanoscale interconnects /

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Size-dependent resistivity in nanoscale interconnects /

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Opis bibliograficzny
1. autor:	Josell, Daniel.
Kolejni autorzy:	Brongersma, Sywert H., Tokei, Zsolt.
Format:	Artykuł
Język:	English
Hasła przedmiotowe:	Conductivity Copper Electrical resistivity Interconnects Nanowires Size effects
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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