Size-dependent resistivity in nanoscale interconnects /

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Size-dependent resistivity in nanoscale interconnects /

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Библиографические подробности
Главный автор:	Josell, Daniel.
Другие авторы:	Brongersma, Sywert H., Tokei, Zsolt.
Формат:	Статья
Язык:	English
Предметы:	Conductivity Copper Electrical resistivity Interconnects Nanowires Size effects
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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