Size-dependent resistivity in nanoscale interconnects /

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Size-dependent resistivity in nanoscale interconnects /

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Detalles Bibliográficos
Autor Principal:	Josell, Daniel.
Outros autores:	Brongersma, Sywert H., Tokei, Zsolt.
Formato:	Artigo
Idioma:	English
Những chủ đề:	Conductivity Copper Electrical resistivity Interconnects Nanowires Size effects
Các nhãn:	Engadir etiqueta Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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