Electromigration and thermomigration in pb-free flip-chip solder joints /

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Electromigration and thermomigration in pb-free flip-chip solder joints /

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Bibliografske podrobnosti
Glavni avtor:	Chen, Chih.
Drugi avtorji:	Tong, H.M., Tu K.N.
Format:	Bài viết
Jezik:	English
Teme:	Current stressing Diffusion Joule heating Microelectronic packaging Reliability Thermal gradient Underbump metallizaiton
Oznake:	Označite Brez oznak, prvi označite!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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