Electromigration in ULSI Interconnections /

Đã lưu trong:

Sonraí Bibleagrafaíochta
Príomhúdar:	Tan, Cher Ming, 1959-
Formáid:	Sách giấy
Foilsithe:	Singapore ; Hackensack, NJ : World Scientific, c2010.
Sraith:	International series on advances in solid state electronics and technology.
Ábhair:	Electrodiffusion. Integrated circuits > Ultra large scale integration.
Clibeanna:	Cuir Clib Leis Gan Chlibeanna, Bí ar an gcéad duine leis an taifead seo a chlibeáil!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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Electromigration in ULSI Interconnections /

Míreanna Comhchosúla