Electromigration in ULSI Interconnections /

Electromigration in ULSI Interconnections /

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Détails bibliographiques
Auteur principal:	Tan, Cher Ming, 1959-
Format:	Sách giấy
Publié:	Singapore ; Hackensack, NJ : World Scientific, c2010.
Collection:	International series on advances in solid state electronics and technology.
Sujets:	Electrodiffusion. Integrated circuits > Ultra large scale integration.
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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