Electromigration in ULSI Interconnections /

Electromigration in ULSI Interconnections /

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Opis bibliograficzny
1. autor:	Tan, Cher Ming, 1959-
Format:	Sách giấy
Wydane:	Singapore ; Hackensack, NJ : World Scientific, c2010.
Seria:	International series on advances in solid state electronics and technology.
Hasła przedmiotowe:	Electrodiffusion. Integrated circuits > Ultra large scale integration.
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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