Electromigration in ULSI Interconnections /

Electromigration in ULSI Interconnections /

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書目詳細資料
主要作者:	Tan, Cher Ming, 1959-
格式:	Sách giấy
出版:	Singapore ; Hackensack, NJ : World Scientific, c2010.
叢編:	International series on advances in solid state electronics and technology.
主題:	Electrodiffusion. Integrated circuits > Ultra large scale integration.
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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