Roles of gate-oxide thickness reduction in scaling bulk and thin-body tunnel field-effect transistors

Tunnel field-effect transistor (TFET) has recently been considered as a promising candidate for low-power integrated circuits. In this paper, we present an adequate examination on the roles of gate-oxide thickness reduction in scaling bulk and thin-body TFETs. It is shown that the short-channel perf...

全面介紹

Đã lưu trong:
書目詳細資料
Những tác giả chính: Nguyễn, Đăng Chiến, Dao Thi Kim Anh, Chun-Hsing Shih
格式: Journal article
語言:English
出版: 2023
主題:
在線閱讀:https://scholar.dlu.edu.vn/handle/123456789/2076
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!
Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt