Threshold voltage of Ge channel MOSFETs with high-k gate insulator

As the MOSFET devices scale into nanoscale regime, it is increasingly difficult to enhance the performance of silicon CMOS devices through traditional scaling approaches. Ge channel MOSFETs with high -k gate insulator become one of most attracting candidates for the use in fut...

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Bibliografiset tiedot
Päätekijät: Chun-Hsing Shih, Jhong-Sheng Wang, Nguyễn, Đăng Chiến, Sau-Mou Wu
Aineistotyyppi: Conference paper
Kieli:English
Julkaistu: Sweden 2024
Linkit:https://scholar.dlu.edu.vn/handle/123456789/3303
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