Threshold voltage of Ge channel MOSFETs with high-k gate insulator

As the MOSFET devices scale into nanoscale regime, it is increasingly difficult to enhance the performance of silicon CMOS devices through traditional scaling approaches. Ge channel MOSFETs with high -k gate insulator become one of most attracting candidates for the use in fut...

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Hlavní autoři: Chun-Hsing Shih, Jhong-Sheng Wang, Nguyễn, Đăng Chiến, Sau-Mou Wu
Médium: Conference paper
Jazyk:English
Vydáno: Sweden 2024
On-line přístup:https://scholar.dlu.edu.vn/handle/123456789/3303
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