Quantum Confinement Effect in Strained-Si¬1-xGex Double-Gate Tunnel Field-Effect Transistors

The energy bandgap is a key factor to determine the tunneling current in tunnel field-effect transistors (TFETs). This paper numerically investigates the effect of quantum confinement in the double-gate TFETs by evaluating the effective energy-band bandgap of the ultra-thin strained-Si1-xGex body....

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Bibliografski detalji
Glavni autori: Nguyễn, Đăng Chiến, Chun-Hsing Shih, Luu The Vinh, Nguyen Van Kien
Format: Conference paper
Jezik:English
Izdano: IEEE Publishing 2024
Online pristup:https://scholar.dlu.edu.vn/handle/123456789/3308
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