Short-drain effect of 5 nm tunnel field-effect transistors

Unique short-drain effect was reported in extremely scaled tunnel field-effect transistors. This study numerically elucidated the short-drain effect and the difference between the short-channel and short-drain effects. For the short-drain effect, the off-state barriers reduce because of decreased dr...

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Những tác giả chính: Yu-Hsuan Chen, Nguyễn, Đăng Chiến, Jr-Jie Tsai, Yan-Xiang Luo, Chun-Hsing Shih
Định dạng: Conference paper
Ngôn ngữ:English
Được phát hành: IEEE Publishing 2024
Truy cập trực tuyến:https://scholar.dlu.edu.vn/handle/123456789/3310
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spelling oai:scholar.dlu.edu.vn:123456789-33102024-03-02T10:23:40Z Short-drain effect of 5 nm tunnel field-effect transistors Yu-Hsuan Chen Nguyễn, Đăng Chiến Jr-Jie Tsai Yan-Xiang Luo Chun-Hsing Shih Unique short-drain effect was reported in extremely scaled tunnel field-effect transistors. This study numerically elucidated the short-drain effect and the difference between the short-channel and short-drain effects. For the short-drain effect, the off-state barriers reduce because of decreased drain lengths, generating ambipolar off-state current and degraded short-channel effect. The shorter channel is, the more pronounced is the short-drain effect. 57-58 2024-03-02T10:23:32Z 2024-03-02T10:23:32Z 2015 Conference paper Bài báo đăng trên KYHT quốc tế (có ISBN) 978-4-8634-8538-9 https://scholar.dlu.edu.vn/handle/123456789/3310 en Silicon Nanoelectronics Workshop (SNW) [1] Dmitri E. Nikonov and Ian A. Young, “Overview of beyond-CMOS devices and a uniform methodology for their benchmarking,” Proc. of the IEEE, p. 2498, 2013. [2] L. Liu, D. Mohata, and S. Datta, “Scaling length theory of double-gate interband tunnel field-effect transistors,” IEEE Trans. Electron Devices, p. 902, 2012. [3] C.-H. Shih and N. V. Kien, “Sub-10-nm asymmetric junctionless tunnel field-effect transistors,” IEEE Journal of the Electron Devices Society, p. 128, 2014. [4] Synopsys Sentaurus Device User Guide, Synopsys Inc., Mountain View, CA, USA, 2010. IEEE Publishing USA
institution Thư viện Trường Đại học Đà Lạt
collection Thư viện số
language English
description Unique short-drain effect was reported in extremely scaled tunnel field-effect transistors. This study numerically elucidated the short-drain effect and the difference between the short-channel and short-drain effects. For the short-drain effect, the off-state barriers reduce because of decreased drain lengths, generating ambipolar off-state current and degraded short-channel effect. The shorter channel is, the more pronounced is the short-drain effect.
format Conference paper
author Yu-Hsuan Chen
Nguyễn, Đăng Chiến
Jr-Jie Tsai
Yan-Xiang Luo
Chun-Hsing Shih
spellingShingle Yu-Hsuan Chen
Nguyễn, Đăng Chiến
Jr-Jie Tsai
Yan-Xiang Luo
Chun-Hsing Shih
Short-drain effect of 5 nm tunnel field-effect transistors
author_facet Yu-Hsuan Chen
Nguyễn, Đăng Chiến
Jr-Jie Tsai
Yan-Xiang Luo
Chun-Hsing Shih
author_sort Yu-Hsuan Chen
title Short-drain effect of 5 nm tunnel field-effect transistors
title_short Short-drain effect of 5 nm tunnel field-effect transistors
title_full Short-drain effect of 5 nm tunnel field-effect transistors
title_fullStr Short-drain effect of 5 nm tunnel field-effect transistors
title_full_unstemmed Short-drain effect of 5 nm tunnel field-effect transistors
title_sort short-drain effect of 5 nm tunnel field-effect transistors
publisher IEEE Publishing
publishDate 2024
url https://scholar.dlu.edu.vn/handle/123456789/3310
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