Sub-10nm tunnel field-effect transistor with graded Si/Ge heterojunction

This study presents a new sub-10-nm tunnel field-effect transistor (TFET) with bandgap engineering using a graded Si/Ge heterojunction. Both the height and width of the tunneling barrier are highly controlled by applying gate voltages to ensure a near ideal sub-5-mV/dec switching of scaled sub-10-nm...

पूर्ण विवरण

में बचाया:
ग्रंथसूची विवरण
मुख्य लेखकों: Chun-Hsing Shih, Nguyễn, Đăng Chiến
स्वरूप: Journal article
भाषा:English
प्रकाशित: IEEE Publishing 2024
विषय:
ऑनलाइन पहुंच:https://scholar.dlu.edu.vn/handle/123456789/3297
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