VLSI test principles and architectures : Design for testability

This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. V...

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Được phát hành: Amsterdam Elsevier Morgan Kaufmann Publishers 2006
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Thư viện lưu trữ: Trung tâm Học liệu Trường Đại học Cần Thơ
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245 0 |a VLSI test principles and architectures : 
245 0 |b Design for testability 
245 0 |c Edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen 
260 |a Amsterdam 
260 |b Elsevier Morgan Kaufmann Publishers 
260 |c 2006 
520 |a This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. VLSI Testing is very basic to the semiconductor industry and is something that almost everyone in the industry needs to have some knowledge of. It is often not sufficiently covered in undergraduate curricula; therefore this book fill the gap in this area for both students and professionals in semiconductor manufacturing, design, systems, electronic design automation (EDA), etc. As 100 million transistor designs are now common, test costs are 25-40% of the overall cost of manufacturing a chip and how a chip is designed greatly impacts the cost of test. As such, it is important for designers and managers to understand the concepts and principles of testing and design-for-test techniques. 
650 |a Integrated circuits,Integrated circuits,Mạch tích hợp,Mạch tích hợp 
650 |x Very large scale integration,Testing,Very large scale integration,Design,Mạch tích hợp quy mô lớn,Kiểm tra,Mạch tích hợp quy mô lớn,Thiết kế 
904 |i Trọng Hải 
980 |a Trung tâm Học liệu Trường Đại học Cần Thơ