VLSI test principles and architectures : Design for testability

This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. V...

Fuld beskrivelse

Đã lưu trong:
Bibliografiske detaljer
Format: Bog
Sprog:Undetermined
Udgivet: Amsterdam Elsevier Morgan Kaufmann Publishers 2006
Fag:
Tags: Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!
Thư viện lưu trữ: Trung tâm Học liệu Trường Đại học Cần Thơ