VLSI test principles and architectures : Design for testability

This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. V...

Descripción completa

Guardado en:

Detalles Bibliográficos
Formato:	Libro
Lenguaje:	Undetermined
Publicado:	Amsterdam Elsevier Morgan Kaufmann Publishers 2006
Materias:	Integrated circuits,Integrated circuits,Mạch tích hợp,Mạch tích hợp Very large scale integration,Testing,Very large scale integration,Design,Mạch tích hợp quy mô lớn,Kiểm tra,Mạch tích hợp quy mô lớn,Thiết kế
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

Sea el primero en dejar un comentario!

VLSI test principles and architectures : Design for testability

Ejemplares similares