VLSI test principles and architectures : Design for testability

This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. V...

Fuld beskrivelse

Đã lưu trong:

Bibliografiske detaljer
Format:	Bog
Sprog:	Undetermined
Udgivet:	Amsterdam Elsevier Morgan Kaufmann Publishers 2006
Fag:	Integrated circuits,Integrated circuits,Mạch tích hợp,Mạch tích hợp Very large scale integration,Testing,Very large scale integration,Design,Mạch tích hợp quy mô lớn,Kiểm tra,Mạch tích hợp quy mô lớn,Thiết kế
Tags:	Tilføj Tag Ingen Tags, Vær først til at tagge denne postø!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

Vær først til at give en kommentarø!

VLSI test principles and architectures : Design for testability

Lignende værker