VLSI test principles and architectures :

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VLSI test principles and architectures : Design for testability

This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. V...

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Библиографические подробности
Формат:	‌
Язык:	Undetermined
Опубликовано:	Amsterdam Elsevier Morgan Kaufmann Publishers 2006
Предметы:	Integrated circuits,Integrated circuits,Mạch tích hợp,Mạch tích hợp Very large scale integration,Testing,Very large scale integration,Design,Mạch tích hợp quy mô lớn,Kiểm tra,Mạch tích hợp quy mô lớn,Thiết kế
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

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