VLSI test principles and architectures : Design for testability
This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. V...
محفوظ في:
| التنسيق: | كتاب |
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| اللغة: | Undetermined |
| منشور في: |
Amsterdam
Elsevier Morgan Kaufmann Publishers
2006
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| الموضوعات: | |
| الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
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| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
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