VLSI test principles and architectures :

क्यूआर कोड

VLSI test principles and architectures : Design for testability

This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. V...

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ग्रंथसूची विवरण
स्वरूप:	पुस्तक
भाषा:	Undetermined
प्रकाशित:	Amsterdam Elsevier Morgan Kaufmann Publishers 2006
विषय:	Integrated circuits,Integrated circuits,Mạch tích hợp,Mạch tích hợp Very large scale integration,Testing,Very large scale integration,Design,Mạch tích hợp quy mô lớn,Kiểm tra,Mạch tích hợp quy mô lớn,Thiết kế
टैग :	टैग जोड़ें कोई टैग नहीं, इस रिकॉर्ड को टैग करने वाले पहले व्यक्ति बनें!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

समान संसाधन

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CMOS VLSI design :
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Coplanar microwave integrated circuits
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Coplanar microwave integrated circuits
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Hướng dẫn thí nghiệm DSP sử dụng FPGA
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Integrated circuit design
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Design of analog CMOS integrated circuits
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Digital design :bprinciples and practices
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High performance ASIC design : Using synthesizable domino logic in an ASIC flow
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Analog VLSI

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CMOS digital integrated circuits
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Digital integrated circuits
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Asymmetric passive components in microwave integrated circuits
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