VLSI test principles and architectures : Design for testability
This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. V...
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| Format: | Livre |
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| Langue: | Undetermined |
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Amsterdam
Elsevier Morgan Kaufmann Publishers
2006
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| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
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