VLSI test principles and architectures : Design for testability

This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. V...

詳細記述

保存先:

書誌詳細
フォーマット:	図書
言語:	Undetermined
出版事項:	Amsterdam Elsevier Morgan Kaufmann Publishers 2006
主題:	Integrated circuits,Integrated circuits,Mạch tích hợp,Mạch tích hợp Very large scale integration,Testing,Very large scale integration,Design,Mạch tích hợp quy mô lớn,Kiểm tra,Mạch tích hợp quy mô lớn,Thiết kế
タグ:	タグ追加タグなし, このレコードへの初めてのタグを付けませんか!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

VLSI test principles and architectures : Design for testability

類似資料