Surface analysis of polymers by XPS and static SIMS
This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...
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| Autor principal: | |
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| Formato: | Livro |
| Idioma: | Undetermined |
| Publicado em: |
Cambridge
Cambridge University Press
1998
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| Assuntos: | |
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| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
|---|
| LEADER | 01094nam a2200217Ia 4500 | ||
|---|---|---|---|
| 001 | CTU_168355 | ||
| 008 | 210402s9999 xx 000 0 und d | ||
| 020 | |c 44.89 | ||
| 082 | |a 620.192 | ||
| 082 | |b B854 | ||
| 100 | |a Briggs, D | ||
| 245 | 0 | |a Surface analysis of polymers by XPS and static SIMS | |
| 245 | 0 | |c D. Briggs | |
| 260 | |a Cambridge | ||
| 260 | |b Cambridge University Press | ||
| 260 | |c 1998 | ||
| 520 | |a This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. | ||
| 650 | |a Polymers,X-ray spectroscopy,Secondary ion mass Spectrometry,Polyme,Tia X,Khối lượng ion | ||
| 650 | |x Surfaces,Analysis,Bề mặt,Phân tích | ||
| 904 | |i Lan | ||
| 980 | |a Trung tâm Học liệu Trường Đại học Cần Thơ | ||