Surface analysis of polymers by XPS and static SIMS

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...

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Chi tiết về thư mục
Tác giả chính:	Briggs, D
Định dạng:	Sách
Ngôn ngữ:	Undetermined
Được phát hành:	Cambridge Cambridge University Press 1998
Những chủ đề:	Polymers,X-ray spectroscopy,Secondary ion mass Spectrometry,Polyme,Tia X,Khối lượng ion Surfaces,Analysis,Bề mặt,Phân tích
Các nhãn:	Thêm thẻ Không có thẻ, Là người đầu tiên thẻ bản ghi này!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ


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082			\|b B854
100			\|a Briggs, D
245		0	\|a Surface analysis of polymers by XPS and static SIMS
245		0	\|c D. Briggs
260			\|a Cambridge
260			\|b Cambridge University Press
260			\|c 1998
520			\|a This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving.
650			\|a Polymers,X-ray spectroscopy,Secondary ion mass Spectrometry,Polyme,Tia X,Khối lượng ion
650			\|x Surfaces,Analysis,Bề mặt,Phân tích
904			\|i Lan
980			\|a Trung tâm Học liệu Trường Đại học Cần Thơ

Surface analysis of polymers by XPS and static SIMS

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