Surface analysis of polymers by XPS and static SIMS
This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...
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| Format: | Book |
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Cambridge
Cambridge University Press
1998
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| Institutions: | Trung tâm Học liệu Trường Đại học Cần Thơ |
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