Surface analysis of polymers by XPS and static SIMS

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...

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書誌詳細
第一著者: Briggs, D
フォーマット: 図書
言語:Undetermined
出版事項: Cambridge Cambridge University Press 1998
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Thư viện lưu trữ: Trung tâm Học liệu Trường Đại học Cần Thơ
その他の書誌記述
要約:This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving.