Surface analysis of polymers by XPS and static SIMS

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Surface analysis of polymers by XPS and static SIMS

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...

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সংরক্ষণ করুন:

গ্রন্থ-পঞ্জীর বিবরন
প্রধান লেখক:	Briggs, D
বিন্যাস:	গ্রন্থ
ভাষা:	Undetermined
প্রকাশিত:	Cambridge Cambridge University Press 1998
বিষয়গুলি:	Polymers,X-ray spectroscopy,Secondary ion mass Spectrometry,Polyme,Tia X,Khối lượng ion Surfaces,Analysis,Bề mặt,Phân tích
ট্যাগগুলো:	ট্যাগ যুক্ত করুন কোনো ট্যাগ নেই, প্রথমজন হিসাবে ট্যাগ করুন!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

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