Surface analysis of polymers by XPS and static SIMS

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Surface analysis of polymers by XPS and static SIMS

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...

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Библиографические подробности
Главный автор:	Briggs, D
Формат:	‌
Язык:	Undetermined
Опубликовано:	Cambridge Cambridge University Press 1998
Предметы:	Polymers,X-ray spectroscopy,Secondary ion mass Spectrometry,Polyme,Tia X,Khối lượng ion Surfaces,Analysis,Bề mặt,Phân tích
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

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