Surface analysis of polymers by XPS and static SIMS

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Surface analysis of polymers by XPS and static SIMS

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...

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מידע ביבליוגרפי
מחבר ראשי:	Briggs, D
פורמט:	ספר
שפה:	Undetermined
יצא לאור:	Cambridge Cambridge University Press 1998
נושאים:	Polymers,X-ray spectroscopy,Secondary ion mass Spectrometry,Polyme,Tia X,Khối lượng ion Surfaces,Analysis,Bề mặt,Phân tích
תגים:	הוספת תג אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

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Introduction to X-ray spectrometric analysis
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Handbook of X-ray spectrometry
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Simultaneous time-of-flight secondary ion MS quantitative analysis of drug surface concentration and polymer degradation kinetics in biodegradable poly(l-lactic acid) blends /
מאת: Lee, Joo-Woon.

Quantitative x-ray spectrometry
מאת: Jenkins, Ron, et al.
יצא לאור: (2014)

Methods of X - Ray and neutron scattering in polymer science
מאת: Roe, Ryong-Joon
יצא לאור: (2000)

Methods of X-ray and neutron scattering in polymer science /
מאת: Roe, R. J.
יצא לאור: (2000)

The fundamentals of X-rays and radium physics
מאת: Selman, Joseph
יצא לאור: (1972)

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מאת: Suzer, Sefik.

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יצא לאור: (2008)

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Handbook of X-ray data
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מאת: Schnohr, Claudia S, et al.
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יצא לאור: (2014)

Methods and materials in microelectronic technology
מאת: Bargon, Joachim
יצא לאור: (1984)

Environmental, mineralogical, genetic characterization of ochreous and white precipitates from acid mine drainages in Taebaeg, Korea /
מאת: Kim, Jeong Jin.

Analysis of a retan agent used in the tanning process and its determination in tannery wastewater /

Electron interaction with gel dosimeters : Effective atomic numbers for collisional, radiative and total interaction processes /

Symposium on X-Ray lithography in Japan
מאת: Davis, Keneth
יצא לאור: (1991)

Quantitative elemental analysis for rhodium and palladium in minerals by time-of-flight resonance ionization mass spectrometry /
מאת: Dimov, S. S.

Impact energy dependence of SF5+-induced damage in poly(methyl methacrylate) studied using time-of-flight secondary ion mass spectrometry /
מאת: Wagner, M. S.

Microstructure and microbiology of polymer surfaces
יצא לאור: (1999)

Applications of electron-ion dissociation reactions for analysis of polycationic chitooligosaccharides in fourier transform mass spectrometry /

An introduction to X-ray crystallography
מאת: Woolfson, M M
יצא לאור: (2013)

Use of fourier transform for deconvolution of the unresolved envelope observed in electrospray ionization mass spectrometry of strongly ionic synthetic polymers /
מאת: Prebyl, Benjamin S.

Tài liệu hội nghị điện quang can thiệp toàn quốc lần thứ 4 28-29/04/2016 =
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Hình ảnh học sọ não :
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Lowering the detection limit of ion-selective plastic membrane electrodes with conducting polymer solid contact and conducting polymer potentiometric sensors /
מאת: Michalska, Agata.

Kĩ thuật X quang
מאת: Nguyễn Văn Hanh
יצא לאור: (1977)

Manuel de radioprotection dans les hôpitaux et en pratique générale; V5
מאת: W Minder
יצא לאור: (1981)

Elements of modern X-ray physics /
מאת: Als-Nielsen, Jens, 1937-
יצא לאור: (2001)