Surface analysis of polymers by XPS and static SIMS

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...

Cur síos iomlán

Đã lưu trong:
Sonraí Bibleagrafaíochta
Príomhúdar: Briggs, D
Formáid: Leabhar
Teanga:Undetermined
Foilsithe: Cambridge Cambridge University Press 1998
Ábhair:
Clibeanna: Cuir Clib Leis
Gan Chlibeanna, Bí ar an gcéad duine leis an taifead seo a chlibeáil!
Thư viện lưu trữ: Trung tâm Học liệu Trường Đại học Cần Thơ

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