Surface analysis of polymers by XPS and static SIMS

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Surface analysis of polymers by XPS and static SIMS

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...

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Αποθηκεύτηκε σε:

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Briggs, D
Μορφή:	Βιβλίο
Γλώσσα:	Undetermined
Έκδοση:	Cambridge Cambridge University Press 1998
Θέματα:	Polymers,X-ray spectroscopy,Secondary ion mass Spectrometry,Polyme,Tia X,Khối lượng ion Surfaces,Analysis,Bề mặt,Phân tích
Ετικέτες:	Προσθήκη ετικέτας Δεν υπάρχουν, Καταχωρήστε ετικέτα πρώτοι!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

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