Surface analysis of polymers by XPS and static SIMS

क्यूआर कोड

Surface analysis of polymers by XPS and static SIMS

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...

पूर्ण विवरण

में बचाया:

ग्रंथसूची विवरण
मुख्य लेखक:	Briggs, D
स्वरूप:	पुस्तक
भाषा:	Undetermined
प्रकाशित:	Cambridge Cambridge University Press 1998
विषय:	Polymers,X-ray spectroscopy,Secondary ion mass Spectrometry,Polyme,Tia X,Khối lượng ion Surfaces,Analysis,Bề mặt,Phân tích
टैग :	टैग जोड़ें कोई टैग नहीं, इस रिकॉर्ड को टैग करने वाले पहले व्यक्ति बनें!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

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