Surface analysis of polymers by XPS and static SIMS

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Surface analysis of polymers by XPS and static SIMS

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful tec...

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書目詳細資料
主要作者:	Briggs, D
格式:	圖書
語言:	Undetermined
出版:	Cambridge Cambridge University Press 1998
主題:	Polymers,X-ray spectroscopy,Secondary ion mass Spectrometry,Polyme,Tia X,Khối lượng ion Surfaces,Analysis,Bề mặt,Phân tích
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

Thư viện lưu trữ:	Trung tâm Học liệu Trường Đại học Cần Thơ

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