Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /

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書目詳細資料
企業作者: International Symposium on Electron Beam Ion Sources and Traps and their Applications Upton, N.Y.)
其他作者: Prelec, Krsto.
格式: Sách giấy
出版: Melville, N.Y. : American Institute of Physics, 2001.
叢編:AIP conference proceedings ; no. 572.
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Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt
實物特徵
實物描述:xiv, 304 p. : ill. ; 25 cm.
參考書目:Includes bibliographical references and index.
ISBN:0735400113