Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /
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| Formaat: | Sách giấy |
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Melville, N.Y. :
American Institute of Physics,
2001.
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| Reeks: | AIP conference proceedings ;
no. 572. |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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