Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /

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Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /

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Podrobná bibliografie
Korporativní autor:	International Symposium on Electron Beam Ion Sources and Traps and their Applications Upton, N.Y.)
Další autoři:	Prelec, Krsto.
Médium:	Sách giấy
Vydáno:	Melville, N.Y. : American Institute of Physics, 2001.
Edice:	AIP conference proceedings ; no. 572.
Témata:	Electron beams > Congresses. Ion sources > Congresses.
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo otaguje tento záznam!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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