Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /
Gardado en:
| Autor Corporativo: | International Symposium on Electron Beam Ion Sources and Traps and their Applications Upton, N.Y.) |
|---|---|
| Outros autores: | Prelec, Krsto. |
| Formato: | Sách giấy |
| Publicado: |
Melville, N.Y. :
American Institute of Physics,
2001.
|
| Series: | AIP conference proceedings ;
no. 572. |
| Những chủ đề: | |
| Các nhãn: |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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