Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /

QR Kodea

Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /

Gorde:

Xehetasun bibliografikoak
Erakunde egilea:	International Symposium on Electron Beam Ion Sources and Traps and their Applications Upton, N.Y.)
Beste egile batzuk:	Prelec, Krsto.
Formatua:	Sách giấy
Argitaratua:	Melville, N.Y. : American Institute of Physics, 2001.
Saila:	AIP conference proceedings ; no. 572.
Gaiak:	Electron beams > Congresses. Ion sources > Congresses.
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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