Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /
محفوظ في:
| مؤلف مشترك: | International Symposium on Electron Beam Ion Sources and Traps and their Applications Upton, N.Y.) |
|---|---|
| مؤلفون آخرون: | Prelec, Krsto. |
| التنسيق: | Sách giấy |
| منشور في: |
Melville, N.Y. :
American Institute of Physics,
2001.
|
| سلاسل: | AIP conference proceedings ;
no. 572. |
| الموضوعات: | |
| الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
|
| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
|---|
مواد مشابهة
-
The physics and applications of high brightness electron beams : proceedings of the 46th Workshop of the INFN ELOISATRON Project : Erice, Italy, 9-14 October 2005 /
منشور في: (2007) -
Methods and materials in microelectronic technology
بواسطة: Bargon, Joachim
منشور في: (1984) -
SPIN 2004 : 16th international spin physics symposium : workshop on polarized electron sources and polarimeters /
منشور في: (2005) -
Spin 2000 : 14th International Spin Physics Symposium, Osaka, Japan, 16-21 October 2000 /
منشور في: (2001) -
Quantum aspects of beam physics
بواسطة: Joint ICFA Advanced Beam Dynamics and Advanced & Novel Accelerators Workshop
منشور في: (2004)


