Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /

Đã lưu trong:
Sonraí Bibleagrafaíochta
Údar Corparáideach: International Symposium on Electron Beam Ion Sources and Traps and their Applications Upton, N.Y.)
Údair Eile: Prelec, Krsto.
Formáid: Sách giấy
Foilsithe: Melville, N.Y. : American Institute of Physics, 2001.
Sraith:AIP conference proceedings ; no. 572.
Ábhair:
Clibeanna: Cuir Clib Leis
Gan Chlibeanna, Bí ar an gcéad duine leis an taifead seo a chlibeáil!
Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt