Fabrication and characterization of silicon probe tip for vertical probe card using MEMS technology /
Tallennettuna:
| Päätekijä: | Kim, Young-Min. |
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| Muut tekijät: | Lee, Jong-Hyun., Yu, In-Sik. |
| Aineistotyyppi: | Artikkeli |
| Kieli: | English |
| Aiheet: | |
| Tagit: |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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