Fabrication and characterization of silicon probe tip for vertical probe card using MEMS technology /
Guardat en:
| Autor principal: | Kim, Young-Min. |
|---|---|
| Altres autors: | Lee, Jong-Hyun., Yu, In-Sik. |
| Format: | Article |
| Idioma: | English |
| Matèries: | |
| Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|
| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
|---|
Ítems similars
-
Amorphization of silicon by 250 keV electron irradiation and hydrogen annealing /
per: Jo, Jung-Yol. - Amperometric detection of quantal catecholamine secretion from individual cells on micromachined silicon chips /
-
Planetary landers and entry probes
per: Ball, Andrew J
Publicat: (2013) - Automated bead alignment apparatus using a single bead capturing technique for fabrication of a miniaturized bead-based DNA probe array /
-
Fluorescent peptide probes for high-throughput measurement of protein phosphatases /
per: Noble, James E.