Fabrication and characterization of silicon probe tip for vertical probe card using MEMS technology /
Kaydedildi:
| Yazar: | Kim, Young-Min. |
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| Diğer Yazarlar: | Lee, Jong-Hyun., Yu, In-Sik. |
| Materyal Türü: | Makale |
| Dil: | English |
| Konular: | |
| Etiketler: |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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