Separation and quantification of parasitic resistance in nano-scale silicon MOSFET /
Sparad:
| Övriga upphovsmän: | Lee, Hoong-Joo., Lee, Jun-Ha., Song, Young-Jin., Yoon, Young-Sik. |
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| Materialtyp: | Artikel |
| Språk: | English |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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