Sub-10nm tunnel field-effect transistor with graded Si/Ge heterojunction

This study presents a new sub-10-nm tunnel field-effect transistor (TFET) with bandgap engineering using a graded Si/Ge heterojunction. Both the height and width of the tunneling barrier are highly controlled by applying gate voltages to ensure a near ideal sub-5-mV/dec switching of scaled sub-10-nm...

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Hlavní autoři: Chun-Hsing Shih, Nguyễn, Đăng Chiến
Médium: Journal article
Jazyk:English
Vydáno: IEEE Publishing 2024
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On-line přístup:https://scholar.dlu.edu.vn/handle/123456789/3297
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