DIFFERENT ROLES AND DESIGNS OF HETERO-GATE DIELECTRIC IN SINGLE- AND DOUBLE-GATE TUNNEL FIELD-EFFECT TRANSISTORS
Hetero-gate dielectric (HGD) engineering not only suppresses the ambipolar current but also enhances the on-current of tunnel field-effect transistors (TFETs). Based on two-dimensional device simulations, we examined the roles and designs of hetero-gate dielectric structure in single- and double-gat...
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Trường Đại học Đà Lạt
2023
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oai:scholar.dlu.edu.vn:DLU123456789-1143752023-10-27T14:45:53Z DIFFERENT ROLES AND DESIGNS OF HETERO-GATE DIELECTRIC IN SINGLE- AND DOUBLE-GATE TUNNEL FIELD-EFFECT TRANSISTORS Nguyễn, Đăng Chiến Lưu, Thế Vinh Huỳnh, Thị Hồng Thắm Chun-Hsing, Shih Hetero-gate dielectric (HGD) engineering not only suppresses the ambipolar current but also enhances the on-current of tunnel field-effect transistors (TFETs). Based on two-dimensional device simulations, we examined the roles and designs of hetero-gate dielectric structure in single- and double-gate TFETs. Proper comparisons and analyses show that the roles and designs of source-side dielectric heterojunctions are similar, whereas those of drain-side dielectric heterojunctions are extremely different in single- and double-gate TFETs. For both device structures, the optimal position of a source-side dielectric heterojunction does not depend on the ratio of low/high-k equivalent oxide thicknesses (EOTs). When increasing the EOT ratio, the on-current enhancement by an optimized source-side dielectric heterojunction is first increased (EOT ratio < 12) and then saturated (EOT ratio > 12). The role of a drain-side dielectric heterojunction in enhancing on-current is limited in double-gate TFETs (every EOT ratio), but significant in single-gate devices (EOT ratio < 12). For EOT ratios < 12, the optimal position of a drain-side dielectric heterojunction in double-gate TFETs is around 2-3 nm farther from the source compared to that in single-gate TFETs. For EOT ratios > 12, the optimal position of a drain-side dielectric heterojunction in double-gate TFETs is not dependent on the EOT ratio, unlike single-gate TFETs. Those differences are due to the difference in the depths of local potential wells in the two TFET structures. 2023-03-04T08:25:29Z 2023-03-04T08:25:29Z 2020 Article 0866-787X https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/114375 https://tckh.dlu.edu.vn/index.php/tckhdhdl/article/view/745 10.37569/DalatUniversity.10.3.745(2020) en Tạp chí Khoa học Đại học Đà Lạt, Tập 10, Số 3; tr. 110-123 application/pdf Trường Đại học Đà Lạt |
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English |
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Hetero-gate dielectric (HGD) engineering not only suppresses the ambipolar current but also enhances the on-current of tunnel field-effect transistors (TFETs). Based on two-dimensional device simulations, we examined the roles and designs of hetero-gate dielectric structure in single- and double-gate TFETs. Proper comparisons and analyses show that the roles and designs of source-side dielectric heterojunctions are similar, whereas those of drain-side dielectric heterojunctions are extremely different in single- and double-gate TFETs. For both device structures, the optimal position of a source-side dielectric heterojunction does not depend on the ratio of low/high-k equivalent oxide thicknesses (EOTs). When increasing the EOT ratio, the on-current enhancement by an optimized source-side dielectric heterojunction is first increased (EOT ratio < 12) and then saturated (EOT ratio > 12). The role of a drain-side dielectric heterojunction in enhancing on-current is limited in double-gate TFETs (every EOT ratio), but significant in single-gate devices (EOT ratio < 12). For EOT ratios < 12, the optimal position of a drain-side dielectric heterojunction in double-gate TFETs is around 2-3 nm farther from the source compared to that in single-gate TFETs. For EOT ratios > 12, the optimal position of a drain-side dielectric heterojunction in double-gate TFETs is not dependent on the EOT ratio, unlike single-gate TFETs. Those differences are due to the difference in the depths of local potential wells in the two TFET structures. |
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Nguyễn, Đăng Chiến Lưu, Thế Vinh Huỳnh, Thị Hồng Thắm Chun-Hsing, Shih |
spellingShingle |
Nguyễn, Đăng Chiến Lưu, Thế Vinh Huỳnh, Thị Hồng Thắm Chun-Hsing, Shih DIFFERENT ROLES AND DESIGNS OF HETERO-GATE DIELECTRIC IN SINGLE- AND DOUBLE-GATE TUNNEL FIELD-EFFECT TRANSISTORS |
author_facet |
Nguyễn, Đăng Chiến Lưu, Thế Vinh Huỳnh, Thị Hồng Thắm Chun-Hsing, Shih |
author_sort |
Nguyễn, Đăng Chiến |
title |
DIFFERENT ROLES AND DESIGNS OF HETERO-GATE DIELECTRIC IN SINGLE- AND DOUBLE-GATE TUNNEL FIELD-EFFECT TRANSISTORS |
title_short |
DIFFERENT ROLES AND DESIGNS OF HETERO-GATE DIELECTRIC IN SINGLE- AND DOUBLE-GATE TUNNEL FIELD-EFFECT TRANSISTORS |
title_full |
DIFFERENT ROLES AND DESIGNS OF HETERO-GATE DIELECTRIC IN SINGLE- AND DOUBLE-GATE TUNNEL FIELD-EFFECT TRANSISTORS |
title_fullStr |
DIFFERENT ROLES AND DESIGNS OF HETERO-GATE DIELECTRIC IN SINGLE- AND DOUBLE-GATE TUNNEL FIELD-EFFECT TRANSISTORS |
title_full_unstemmed |
DIFFERENT ROLES AND DESIGNS OF HETERO-GATE DIELECTRIC IN SINGLE- AND DOUBLE-GATE TUNNEL FIELD-EFFECT TRANSISTORS |
title_sort |
different roles and designs of hetero-gate dielectric in single- and double-gate tunnel field-effect transistors |
publisher |
Trường Đại học Đà Lạt |
publishDate |
2023 |
url |
https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/114375 https://tckh.dlu.edu.vn/index.php/tckhdhdl/article/view/745 |
_version_ |
1781718923198070784 |