A C60 primary ion beam system for time of flight secondary ion mass spectrometry : Its development and secondary ion yield characteristics /

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A C60 primary ion beam system for time of flight secondary ion mass spectrometry : Its development and secondary ion yield characteristics /

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Detalhes bibliográficos
Outros Autores:	Blenkinsopp, Paul., Hill, Rowland., Lockyer, Nicholas., Vickerman, John C., Weibel, Daniel., Wong, Steve.
Formato:	Atigo
Idioma:	English
Assuntos:	Fullerenes Ion beam Polymer Secondary ion Secondary ion mass spectrometry
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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