A C60 primary ion beam system for time of flight secondary ion mass spectrometry : Its development and secondary ion yield characteristics /

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A C60 primary ion beam system for time of flight secondary ion mass spectrometry : Its development and secondary ion yield characteristics /

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Detaylı Bibliyografya
Diğer Yazarlar:	Blenkinsopp, Paul., Hill, Rowland., Lockyer, Nicholas., Vickerman, John C., Weibel, Daniel., Wong, Steve.
Materyal Türü:	Makale
Dil:	English
Konular:	Fullerenes Ion beam Polymer Secondary ion Secondary ion mass spectrometry
Etiketler:	Etiketle Etiket eklenmemiş, İlk siz ekleyin!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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