A C60 primary ion beam system for time of flight secondary ion mass spectrometry : Its development and secondary ion yield characteristics /

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A C60 primary ion beam system for time of flight secondary ion mass spectrometry : Its development and secondary ion yield characteristics /

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Opis bibliograficzny
Kolejni autorzy:	Blenkinsopp, Paul., Hill, Rowland., Lockyer, Nicholas., Vickerman, John C., Weibel, Daniel., Wong, Steve.
Format:	Artykuł
Język:	English
Hasła przedmiotowe:	Fullerenes Ion beam Polymer Secondary ion Secondary ion mass spectrometry
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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