Grazing exit electron probe microanalysis of submicrometer inclusions in metallic materials /

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Grazing exit electron probe microanalysis of submicrometer inclusions in metallic materials /

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Détails bibliographiques
Autres auteurs:	Awane, Tohru., Ishikawa, Nobuhiro., Kimura, Takashi., Nakamura, Morihiko., Nishida, Kenji., Tanuma, Shigeo.
Format:	Article
Langue:	English
Sujets:	Dispersive spectrometry Electron microprobe analysis Inclusion Particle Stainless steel Thin film X ray spectrometry
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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