Lonizing radiation effects in mos oxides
This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides.
Wedi'i Gadw mewn:
| Prif Awdur: | |
|---|---|
| Fformat: | Llyfr |
| Iaith: | Vietnamese |
| Cyhoeddwyd: |
Singapore
World Scientific
1999
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| Cyfres: | International advances in solid state electronics and technology
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| Pynciau: | |
| Tagiau: |
Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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| Thư viện lưu trữ: | Thư viện Trường Đại học Nam Cần Thơ |
|---|
| Crynodeb: | This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. |
|---|---|
| Disgrifiad Corfforoll: | xiv, 171 p. 23cm |
| ISBN: | 9810233264 |