Lonizing radiation effects in mos oxides
This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides.
Đã lưu trong:
| Príomhúdar: | |
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| Formáid: | Leabhar |
| Teanga: | Vietnamese |
| Foilsithe: |
Singapore
World Scientific
1999
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| Sraith: | International advances in solid state electronics and technology
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| Ábhair: | |
| Clibeanna: |
Cuir Clib Leis
Gan Chlibeanna, Bí ar an gcéad duine leis an taifead seo a chlibeáil!
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| Thư viện lưu trữ: | Thư viện Trường Đại học Nam Cần Thơ |
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| Achoimre: | This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. |
|---|---|
| Cur Síos Fisiciúil: | xiv, 171 p. 23cm |
| ISBN: | 9810233264 |