Lonizing radiation effects in mos oxides

This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides.

में बचाया:
ग्रंथसूची विवरण
मुख्य लेखक: Oldham, Timothy R
स्वरूप: पुस्तक
भाषा:Vietnamese
प्रकाशित: Singapore World Scientific 1999
श्रृंखला:International advances in solid state electronics and technology
विषय:
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