Lonizing radiation effects in mos oxides
This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides.
में बचाया:
| मुख्य लेखक: | Oldham, Timothy R |
|---|---|
| स्वरूप: | पुस्तक |
| भाषा: | Vietnamese |
| प्रकाशित: |
Singapore
World Scientific
1999
|
| श्रृंखला: | International advances in solid state electronics and technology
|
| विषय: | |
| टैग : |
टैग जोड़ें
कोई टैग नहीं, इस रिकॉर्ड को टैग करने वाले पहले व्यक्ति बनें!
|
| Thư viện lưu trữ: | Thư viện Trường Đại học Nam Cần Thơ |
|---|
समान संसाधन
-
Ionizing radiation effects in MOS oxides
द्वारा: Oldham, Timothy R.
प्रकाशित: (1999) -
Ionzing radiation effects in mos oxides /
द्वारा: Oldham, Timothy R.
प्रकाशित: (1999) -
Ionizing Radiation Effects in Mos Oxides (International Series on Advances in Solid State Electronics and Technology /
द्वारा: Oldham Timothy R
प्रकाशित: (2000) - Radiation nephropathy is not mitigated by antagonists of oxidative stress /
- Chronic oxidative stress as a mechanism for radiation nephropathy /


