Remote hydrogen-nitrogen plasma chemical vapor deposition from a tetramethyldisilazane source. Part 1. Mechanism of the process, structure and surface morphology of deposited amorphous hydrogenated silicon carbonitride films /
Đã lưu trong:
| 其他作者: | Aoki, T., Baszczyk, I., Hatanaka, Y., Klemberg-Sapieha, J. E., Tracz, A., Walkiewicz-Pietrzykowska, A., Wrobel, A. M. |
|---|---|
| 格式: | Bài viết |
| 语言: | English |
| 主题: | |
| 标签: |
添加标签
没有标签, 成为第一个标记此记录!
|
| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
|---|
相似书籍
-
Hydrogen ion diffusion coefficient of a hydrogenated amorphous silicon thin film /
由: Yu, George C. -
Tribological behavior of hydrogenated amorphous carbon films deposited on rubbers /
由: Nguyen Kien Cuong. - Chemical vapor deposition of tantalum carbide and carbonitride thin films from Me3CETa(CH2CMe3)3(E= CH, N) /
- Tetrathiafulvalene-based conducting deposits on silicon substrates /
-
Modified Graphitic Carbon Nitrides for Photocatalytic Hydrogen Evolution from Water:
Copolymers, Sensitizers and Nanoparticles
由: Striegler, Karl
出版: (2015)