Remote hydrogen-nitrogen plasma chemical vapor deposition from a tetramethyldisilazane source. Part 1. Mechanism of the process, structure and surface morphology of deposited amorphous hydrogenated silicon carbonitride films /
محفوظ في:
| مؤلفون آخرون: | Aoki, T., Baszczyk, I., Hatanaka, Y., Klemberg-Sapieha, J. E., Tracz, A., Walkiewicz-Pietrzykowska, A., Wrobel, A. M. |
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| التنسيق: | مقال |
| اللغة: | English |
| الموضوعات: | |
| الوسوم: |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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مواد مشابهة
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Hydrogen ion diffusion coefficient of a hydrogenated amorphous silicon thin film /
بواسطة: Yu, George C. -
Tribological behavior of hydrogenated amorphous carbon films deposited on rubbers /
بواسطة: Nguyen Kien Cuong. - Chemical vapor deposition of tantalum carbide and carbonitride thin films from Me3CETa(CH2CMe3)3(E= CH, N) /
- Tetrathiafulvalene-based conducting deposits on silicon substrates /
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Modified Graphitic Carbon Nitrides for Photocatalytic Hydrogen Evolution from Water:
Copolymers, Sensitizers and Nanoparticles
بواسطة: Striegler, Karl
منشور في: (2015)