Device physics and design of hetero-gate dielectric tunnel field-effect transistors with different low/high-k EOT ratios

The hetero-gate dielectric (HGD) structure was recently experimentally demonstrated to enhance the electrical performance of tunnel field-effect transistors (TFETs). This study examined the mechanisms underlying the HGD structure functioning and investigated the design of the structure to enhance th...

詳細記述

保存先:
書誌詳細
主要な著者: Chun-Hsing Shih, Nguyễn, Đăng Chiến, Trần, Hữu Duy, Phan, Văn Chuân
フォーマット: Journal article
言語:English
出版事項: Springer Nature 2024
主題:
オンライン・アクセス:https://scholar.dlu.edu.vn/handle/123456789/3290
タグ: タグ追加
タグなし, このレコードへの初めてのタグを付けませんか!
Thư viện lưu trữ: Thư viện Trường Đại học Đà Lạt

類似資料